Microscope Lamps and Accessories
Ted Pella Inc Low Profile 45º - 90º Mount, short 6mm pin
Low profile 45º / 90º SEM Mount Ø12.7mm, short 6mm pin for ZEISS/LEO. Aluminum, grooved edge.
Electron Microscopy Sciences Metallurgical Graticle G42, 19mm, ASTM E112
Standard pattern discs for metallurgical stereometric analysis of grain size in polished metal sections. Grain sizing (E112) Glass Sandwich.
Size: 19mm
Method: ASTM E112
Surface: Glass sandwich
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-MH-2C, 200 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis.
Mesh: 200
Material: Copper
Electron Microscopy Sciences PS78 Micrometer Standard with UKAS Cert
These stage micrometers are available with a calibration certificate that provides traceability for the precise calibration and confirmation of accuracy of optical measuring instruments, necessary under ISO provisions. The glass discs are mounted in stainless steel slides with engraved serial numbers. Each slide is supplied in a polished wooden storage case. A UKAS accredited laboratory carries out measurements at selected points on the scales and grids and issues a calibration certificate.
Electron Microscopy Sciences Squares Graticle NE38, 16mm, 10 mm, 7 mm and 4 mm squares
Combines three areas in one for convenience, giving area ratios A:B of 1:3 and B:C of 1:2.
Size: 16mm
Divisions: 10 mm, 7 mm and 4 mm squares
Surface: Chrome image
GLOBAL FIA INC MG2 MILLIGAT HFPUMP W/ STEPPER
milliGAT HF pump with stepper motor,controller, communication cable, and 24VDCpower supplyHTS: 8413600040
Electron Microscopy Sciences Thin Sample Holder, 15 mm Pin
Ideal for examination cross section of thin samples, such as wafers, multi-layer of capacitors, plastics, metals, etc. For ISI, JEOL, TOPCON: double set screw for a secure holding of the specimen during observation. 15mm(dia). X 10mm(H), 6.4mm split
Electron Microscopy Sciences Microscope Graticule NE1 Horizontal, 16 mm, 10 mm with 0.1 mm subdivisions
These scales are used for the measuring of lengths of specimen or distances between points on a variety of different shaped objects. By dividing the division of the chosen graticule by the magnification of the objective one obtains an approximate value that each division will represent on the stage. Horizontal micrometer scale.
Size: 16 mm
KLARMANN RULINGS INC Stage Micrometer 1 mm, 100 Divisions
1mm Stage micrometer with 100 divisions. Each division = 0.01mm per division. Numbered 0.0 thru 1.0. The locating circle can be removed.
Cole-Parmer Meiji Techno S-4300+FS Boom Microscope Stand; can be tilted 180°
Use the components below to build a microscope that best suits your application. We offer a variety of microscope bodies, stands, eyepieces, and ring lights. Components are interchangeable—mix and match to design your perfect microscope! Choose from basic microscope stand, standard microscope stands, or boom microscope stands. Order microscope and eyepieces separately.
Electron Microscopy Sciences ISI Topcon SEM Cylinder Mount 5/8" surface, 1/4" height, Aluminum
ISI, ABT, Topcon specimen mountsare made from ultra-pure aluminum, lathe finish.
Head: 5/8"
Height: 1/4"
Structure Probe Inc SILVER PASTE 30G
SPI Conductive Silver Paste Plus, Plus is a high purity, Uniform, Viscous silver particle suspension, Ideal for SEM use, Especially for the mounting of porous samples, 30g